Reliability Testing and Analysis in Industrial Application

24 September 2018 - 26 September 2018
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Course Overview:

This course is outlined to provide the basic fundamental of reliability testing including history, definition, why and when to perform the testing.  The subject also explains the common and appropriate method in defining reliability goal and typical product failure behavior. This course will cover reliability testing methodologies for semiconductor devices and electronic products referring to International Test Standard.


Learning Outcomes:

Upon completion, participants should be able to demonstrate/understand each of the following:

  1. Understand the general concept of Reliability Testing
  2. Understand the need for testing.
  3. Know how to define and set-up reliability goal
  4. Understand the typical product failure


Contact Information:

Tel      : +603 8995 5000 ext 55279 (Fara) / 55642 (Amy)
Email  : ​ /


Closing date for registration is 13th September 2018, Thursday.


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24 September 2018
26 September 2018


MIMOS Berhad
Technology Park Malaysia
Kuala Lumpur, 57000 Malaysia
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