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This course is outlined to provide the basic fundamental of reliability testing including history, definition, why and when to perform the testing. The subject also explains the common and appropriate method in defining reliability goal and typical product failure behavior. This course will cover reliability testing methodologies for semiconductor devices and electronic products referring to International Test Standard.
Upon completion, participants should be able to demonstrate/understand each of the following:
- Understand the general concept of Reliability Testing
- Understand the need for testing.
- Know how to define and set-up reliability goal
- Understand the typical product failure
|Tel||: +603 8995 5000 ext 55279 (Fara) / 55642 (Amy)|
|: firstname.lastname@example.org / email@example.com|
Closing date for registration is 13th September 2018, Thursday.