MIMOS Berhad » Wafer Testing

MIMOS Wafer Fab is the first Malaysian organisation to provide Wafer Sort and Testing facilities. The facility is equipped with the most advanced, fully loaded Automatic Test Equipment (ATE) for evaluating and testing, Digital, Analog Mixed Signal and Memory products.

Amongst the wafer testing services are :

Parametric Test (PCM)
Wafer sort capabilities
CV and IV characteristics
Multi-site Testing (Multiple die testing at one time)
Yield Enhancement (Include yield monitoring and feedback)
Wafer Level Reliability Testing and Monitoring**

**(Include hot carrier degradation, Mobile Ion contamination, Electromigration, CV measurement, Gate Oxide Integrity and Manual measurement)

Our Capabilities

We also have the capabilities to conduct parametric and functional tests at our Test Labs.

MIMOS Wafer Fab Test Labs have the following equipments:-

ELECTROGLAS Fully Auto Prober
TSK Fully Auto Prober
MICROMANIPULATOR Semi-Auto and Manual Prober
IMS/ SUN Test Systems
CREDENCE Memory Tester
AGILENT DC Parametric Tester
HP Semi Parametric Analyzer
CREDENCE Personal Kalos
MERMMERT Bake Oven
KEITHLEY Source Measurement Unit