On 17 June 2025, MIMOS hosted a full-day technical workshop titled ‘Exploring Material Insights: From Laser PFIB to High-Resolution SEM & TEM.’ The event was designed for professionals, researchers, and engineers in the fields of materials science and nanotechnology.
The workshop provided an in-depth exploration of the latest advancements in high-resolution electron microscopy (SEM & TEM) and focused ion beam (FIB) technology. Participants gained valuable insights into how these cutting-edge tools can be utilised to analyse materials at an unprecedented level of detail, driving progress in research and development across various industries.
