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Failure Analysis

MIMOS offers failure analysis for the E&E industry and members of the academia.

Our Failure Analysis, Material Analysis & Nanocharacterisation lab is MS ISO/IEC certified and a NANOVerify programme centre equipped with a complete spectrum of advanced analytical tools to provide high-value-added analytical services such as Electrical Verification, Fault Localisation, Non-Destructive Inspection, Material Analysis, and Physical Analysis.

Electrical Verification
  • Logic and High Voltage Curve Tracer Electrical/parametric test verification tool for logic and high-voltage devices
Non-Destructive Inspection
  • Real-time X-Ray (X-Ray) 2D inspection tool 
  • 3D X-Ray 3D inspection tool 
  • Scanning Acoustic Microscope (SAM) Inspection 
Fault Localisation
  • Photon Emission Microscope (PEM) and Optical Beam Induced Resistance Change (OBIRCH) Fault localisation system 
  •  Thermal Emission Microscope Fault localisation system 
  • Magnetic Current Imaging (MCI) Fault localisation system 
Physical Analysis
  • Laser and Chemical Decapsulator Package opening 
  • Confocal and Digital Microscopes Visual inspection tool 
  • Dual-Beam (FIB and FESEM) High resolution inspection system
  • Field Emission Gun Scanning Electron Microscope (FESEM) 
Material Analysis
  • Auger Electron Spectroscopy (AES)
  • TOF Secondary Ion Mass Spectroscopy (ToF-SIMS)
  • X-Ray Photoelectron Spectroscopy (XPS)
  • TEM Upgrades with Electron Energy Loss Spectroscopy (EELS)
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • Ultraviolet-visible and Infrared Spectroscopy (UV-Vis-IR)
  • Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • Gas Chromatography-Mass Spectroscopy (GC-MS/MS)
  • Nanoidentation